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Events

AUTOTESTCON 2017
Sept. 11 - 14, 2017
Schaumburg, IL

VXI, PXI, IVI, LXI and AXIe Standards Improve ATE Systems Design

Moderator: Bob Helsel, Executive Director of VXIbus, LXI, AXIe Consortia, and PXI Systems Alliance. Director of Services, IVI Foundation

Speakers:
Bob Helsel, Bode Enterprises, LLC - Introductions and Overview
Charles Greenberg, Astronics – VXIbus
Mike Dewey, Marvin Test Solutions – PXI, PXI Express & PXImc
Chris Miller, Keysight Technologies – AXIe
Joe Mueller, Keysight Technologies – IVI
Steve Schink, Keysight Technologies – LXI
Bob Helsel, Bode Enterprises, LLC - Q/A and Close

2017 OUTLOOK OF MODULAR INSTRUMENTATION IN THE TEST AND MEASUREMENT INDUSTRY PANEL


Moderator: Bob Helsel, Executive Director of the PXI Systems Alliance; VXIbus, LXI and AXIe Consortia; President, Bode Enterprises, LLC

Panelists:
• Reggie Rector, Co-Chair, PXISA Marketing Committee; National Instruments
• Dr. Fred Blönnigen, CEO, Bustec Production; Bustec Director, VXIbus Consortium
• Chris Miller, Chairman of the Board, AXIe Consortium, Keysight Technologies
• Steve Schink, Chairman of the Board, LXI Consortium; Marketing Planner, Keysight Technologies

What is the status and outlook for VXI, PXI, LXI, and AXIe instrumentation? Has modular instrumentation become the defacto standard of automated test? In what applications? What does this mean for Mil/Aero applications in particular? Four industry experts will give brief presentations on these topics followed by an interactive panel discussion.
 


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