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From Bob Helsel,
Editor, AXIe Newsletter

Welcome to the December 2015 issue of the AXIe Newsletter.

LinkedInOur AXIe Consortium LinkedIn membership numbers continue to increase and we are now a community of over 335 members. 

YoutubeIf you want to stay abreast of the AXIe standard you can subscribe to the new AXIe consortium YouTube Channel, or view the latest AXIe-0 Overview presentation on the website.

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Acquiring Data for Event
Reconstruction and Analysis

Submitted by Keysight Technologies

Your test goal is to quickly capture many different signals generated from an event and re-construct the data for review and analysis. Timing and synchronization of the signals must be perfectly aligned in order to properly reconstruct the original event. Some signals may require further processing or conversion such as those acquired through transducers. How do you ensure test results are accurately captured?  The challenges of complex high-speed multichannel acquisition systems are discussed further in this article.

Test system challenges
When collecting large amounts of data to reconstruct real-time and fast transient or single-shot events engineers face several test challenges.  Selecting the best instruments to construct a reliable test system for data collection is most important. Capturing multiple real-time signals generated during the event requires a high-speed digitizer that can make many very fast, accurate measurements.  The performance of the digitizer determines the quality of the signal measurements, with accurate triggering and timing across all the channels to ensure reliable reconstruction of the acquired data.  Channel synchronization can become an even greater challenge as the number of monitored signals grows, requiring a complex multi-channel test system configuration.

Read more>>

AXIe Specification Gets an Upgrade

By Larry Desjardin, Modular Methods

Earlier this month, the AXIe Consortium added new capabilities to the AXIe Base Specification. If you are unfamiliar with AXIe, it is a modular instrument standard best described as the “big brother to PXI.” Like PXI, it hosts pluggable instrument and controller modules into a chassis, using PCIe (PCI Express) as a high-speed data fabric. However, the modules are larger than PXI and typically placed horizontally in a chassis. These larger modules allow power dissipation up to 200 watts/slot, suitable for high-speed data converters and digital test. You can read my recent AXIe tutorial here.

Like PXI, AXIe allows instrument modules from multiple vendors to be inserted into the same chassis. The larger module form factor combined with horizontal orientation allows very high power and rack density.







New AXIe Products

The members of the AXIe Consortium continue to release a steady flow of new products based on the AXIe standard, some of which are spotlighted below:

AXIe-1 Base Architecture Specification Products

M9709A AXIe 8-bit High-Speed Digitizer

M8196A 92 GSa/s Arbitrary Waveform Generator

M8062A 32Gb/s J-BERT

AXIe 65 GSa/s & 20 GHz High-Speed Arbitrary Waveform Generator

GT-ASG18A Advanced Signal Generator

M9521A AXIe System Module

M9514A AXIe 14-Slot Chassis


IPMI Shelf Manager Card With Redundant IPMB

M9703A AXIe eight-channel wideband digital receiver/digitizer

M8061A Multiplexer 2:1 With De-Emphasis 28 Gb/s

M8192A Multi-Channel Synchronization Module for M8190A

ADC 6000 Series AXIe-based Digitizer Module

DDR Logic Analyzer U4154A

AWG (Arbitrary Waveform Generator) M8190A

AXIe-3.1 Semiconductor Test Extension Products

AX500 - AXIe Benchtop System

High Volume Production Test System





Thanks to all our readers.
Bob Helsel, Editor


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